Inventor · disambiguated record
Bernd Jungmann
Also filed as: JUNGMANN BERND
1 granted patent·1 pending application·8 citations·filing 2004–2006
30Inventor score
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2 records- 0174US7657077B2Detecting defects by three-way die-to-die comparison with false majority determinationVISTEC SEMICONDUCTOR SYS GMBH·Filed 2006·Granted Feb 2, 2010·8 cites·5 claims
- 0228US2005008217A1Method for defect segmentation in features on semiconductor substratesLEICA MICROSYSTEMS·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →