Inventor · disambiguated record
Tecla Ghilardi
Also filed as: GHILARDI TECLA
12 granted patents·1 pending application·15 citations·filing 2003–2024
85Inventor score
Files withMICRON TECHNOLOGY INC7LODESTAR LICENSING GROUP LLC2ST MICROELECTRONICS SRL2GHILARDI TECLA1LISI CARLO1
Top patents by PatentIndex Score
13 records- 0183US2025063733A1Memory devices including different tier pitchesLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 0281US12160993B2Memory devices including different tier pitches, and related electronic systemsLODESTAR LICENSING GROUP LLC·Filed 2023·Granted Dec 3, 2024·0 cites·19 claims
- 0375US11751396B2Microelectronic devices including varying tier pitch, and related electronic systemsMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 5, 2023·0 cites·17 claims
- 0470US11264404B2Microelectronic devices including a varying tier pitch, and related electronic systems and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·0 cites·24 claims
- 0567US7656712B2Method and circuit for programming a memory cell, in particular of the NOR flash typeLISI CARLO·Filed 2008·Granted Feb 2, 2010·8 cites·28 claims
- 0666US11309039B2Apparatus for determining a pass voltage of a read operationMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 19, 2022·0 cites·21 claims
- 0763US10950316B2Apparatus for determining a pass voltage of a read operationMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 16, 2021·0 cites·20 claims
- 0855US7551465B2Reference cell layout with enhanced RTN immunityGHILARDI TECLA·Filed 2007·Granted Jun 23, 2009·4 cites·20 claims
- 0951US10777286B2Apparatus and methods for determining data states of memory cellsMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 15, 2020·0 cites·22 claims
- 1047US11955175B2Copy redundancy in a key-value data storage system using content addressable memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 1146US11762767B2Storing highly read data at low impact read disturb pages of a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1239US6944061B2Single cell erasing method for recovering memory cells under programming disturbs in non volatile semiconductor memory devicesST MICROELECTRONICS SRL·Filed 2003·Granted Sep 13, 2005·2 cites·12 claims
- 1337US6903995B2Test structure for the measurement of contact to gate distance in non-volatile memory devices and corresponding test methodST MICROELECTRONICS SRL·Filed 2003·Granted Jun 7, 2005·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →