Inventor · disambiguated record
Ayumu Onoyama
Also filed as: ONOYAMA AYUMU
3 granted patents·19 citations·filing 2001–2010
64Inventor score
Top patents by PatentIndex Score
3 records- 0175US6829047B2Defect detection systemMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 7, 2004·15 cites·10 claims
- 0259US8435417B2Method of manufacturing semiconductor deviceNAKATA KAZUNARI·Filed 2010·Granted May 7, 2013·1 cites·5 claims
- 0355US7065238B2Defect inspection method and defect inspection equipmentMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 20, 2006·3 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when Ayumu Onoyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →