Inventor · disambiguated record
Shin-Wook Yi
Also filed as: YI SHIN-WOOK
4 granted patents·1 pending application·5 citations·filing 2012–2019
62Inventor score
Top patents by PatentIndex Score
5 records- 0187US10727025B2System and method of analyzing a crystal defectSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 28, 2020·4 cites·20 claims
- 0254US9103722B2Unit pixels, depth sensors and three-dimensional image sensors including the sameKO HYOUNG-SOO·Filed 2014·Granted Aug 11, 2015·0 cites·20 claims
- 0353US2013148097A1Distance measuring sensorSHIN JAE-SUNG·Filed 2012·Application pending·0 cites
- 0452US8901498B2Unit pixels, depth sensors and three-dimensional image sensors including the sameKO HYOUNG-SOO·Filed 2012·Granted Dec 2, 2014·0 cites·20 claims
- 0549US9229226B2Hybrid apparatus and methods for analyzing electromagnetic wavesYI SHIN-WOOK·Filed 2012·Granted Jan 5, 2016·1 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →