Inventor · disambiguated record
Stewart Bean
Also filed as: BEAN STEWART · BEAN STEWART JOHN
9 granted patents·29 citations·filing 2011–2020
85Inventor score
Technology areasH01J
Top patents by PatentIndex Score
9 records- 0191US11276547B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2020·Granted Mar 15, 2022·2 cites·17 claims
- 0289US10068744B2Charged particle optical apparatus for through-the lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Sep 4, 2018·5 cites·11 claims
- 0388US9741528B2Charged particle optical apparatus having a selectively positionable differential pressure moduleZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Aug 22, 2017·6 cites·38 claims
- 0486US10522321B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Dec 31, 2019·3 cites·16 claims
- 0578US8648301B2Particle beam system having a hollow light guideCarl Zeiss Microscopy Ltd·Filed 2012·Granted Feb 11, 2014·4 cites·19 claims
- 0673US8426812B2Microscope system, method for operating a charged-particle microscopeBEAN STEWART·Filed 2011·Granted Apr 23, 2013·7 cites·20 claims
- 0767US10861670B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 8, 2020·0 cites·36 claims
- 0861US9159532B2Method of analyzing a sample and charged particle beam device for analyzing a sampleCarl Zeiss Microscopy Ltd·Filed 2014·Granted Oct 13, 2015·1 cites·20 claims
- 0956US8859992B2Charged particle beam devicesBEAN STEWART JOHN·Filed 2011·Granted Oct 14, 2014·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →