Inventor · disambiguated record
Michael Albiez
Also filed as: ALBIEZ MICHAEL
15 granted patents·2 pending applications·48 citations·filing 2007–2022
91Inventor score
Files withZEISS CARL MICROSCOPY GMBH8ALBIEZ MICHAEL3MANTZ HUBERT2KAERCHER ALFRED SE & CO KG1LANG MATTHIAS1
Top patents by PatentIndex Score
17 records- 0191US11276547B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2020·Granted Mar 15, 2022·2 cites·17 claims
- 0289US10068744B2Charged particle optical apparatus for through-the lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Sep 4, 2018·5 cites·11 claims
- 0388US9741528B2Charged particle optical apparatus having a selectively positionable differential pressure moduleZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Aug 22, 2017·6 cites·38 claims
- 0486US10522321B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Dec 31, 2019·3 cites·16 claims
- 0586US8450215B2Particle beam systems and methodsMANTZ HUBERT·Filed 2010·Granted May 28, 2013·9 cites·20 claims
- 0680US9354188B2Particle beam device and method for operating a particle beam deviceZEISS CARL MICROSCOPY GMBH·Filed 2013·Granted May 31, 2016·4 cites·15 claims
- 0780US8368020B2Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2011·Granted Feb 5, 2013·4 cites·10 claims
- 0873US8368019B2Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2011·Granted Feb 5, 2013·2 cites·20 claims
- 0973US7888643B2Focusing and positioning device for a particle-optical raster microscopeZEISS CARL NTS GMBH·Filed 2008·Granted Feb 15, 2011·3 cites·17 claims
- 1069US8481933B2Method and device for examining a surface of an objectALBIEZ MICHAEL·Filed 2009·Granted Jul 9, 2013·3 cites·72 claims
- 1167US11139140B2Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatusPREIKSZAS DIRK·Filed 2010·Granted Oct 5, 2021·2 cites·30 claims
- 1267US10861670B2Charged particle optical apparatus for through-the-lens detection of particlesZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 8, 2020·0 cites·36 claims
- 1360US8064714B2Method for binarizing a digital gray value image to generate a binarized gray value image and arrangement for carrying out said methodALBIEZ MICHAEL·Filed 2007·Granted Nov 22, 2011·3 cites·13 claims
- 1451US8131102B2Method for processing a digital gray value image so that a reduced image noise and simultaneously a higher image sharpness is achievedALBIEZ MICHAEL·Filed 2007·Granted Mar 6, 2012·2 cites·13 claims
- 1547US2022280983A1High pressure cleaning system and method for operating a high pressure cleaning systemKAERCHER ALFRED SE & CO KG·Filed 2022·Application pending·0 cites
- 1646US2010200750A1Particle beam systemMANTZ HUBERT·Filed 2010·Application pending·0 cites
- 1733US8779381B2Aperture unit for a particle beam deviceLANG MATTHIAS·Filed 2011·Granted Jul 15, 2014·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →