Inventor · disambiguated record
Osamu Okano
Also filed as: OKANO OSAMU
2 granted patents·12 citations·filing 2004–2004
55Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0158US7516376B2Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer productFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Apr 7, 2009·10 cites·10 claims
- 0238US7315997B2Method and apparatus for supporting designing of LSI, and computer productFUJITSU LTD·Filed 2004·Granted Jan 1, 2008·2 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →