Inventor · disambiguated record
Donato O. Forlenza
Also filed as: FORLENZA DONATO · FORLENZA DONATO O · FORLENZA DONATO ORAZIO
21 granted patents·2 pending applications·242 citations·filing 1995–2014
95Inventor score
Top patents by PatentIndex Score
23 records- 0190US7908532B2Automated system and processing for expedient diagnosis of broken shift registers latch chainsIBM·Filed 2008·Granted Mar 15, 2011·22 cites·20 claims
- 0284US7574644B2Functional pattern logic diagnostic methodIBM·Filed 2005·Granted Aug 11, 2009·15 cites·5 claims
- 0382US8086924B2Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Dec 27, 2011·13 cites·20 claims
- 0482US7934134B2Method and apparatus for performing logic built-in self-testing of an integrated circuitIBM·Filed 2008·Granted Apr 26, 2011·11 cites·15 claims
- 0582US7225374B2ABIST-assisted detection of scan chain defectsIBM·Filed 2003·Granted May 29, 2007·29 cites·20 claims
- 0678US7930601B2AC ABIST diagnostic method, apparatus and program productIBM·Filed 2008·Granted Apr 19, 2011·11 cites·16 claims
- 0777US7392449B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2007·Granted Jun 24, 2008·7 cites·11 claims
- 0877US5930270ALogic built in self-test diagnostic methodIBM·Filed 1997·Granted Jul 27, 1999·41 cites·26 claims
- 0973US7017095B2Functional pattern logic diagnostic methodIBM·Filed 2002·Granted Mar 21, 2006·15 cites·6 claims
- 1072US7921346B2Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)IBM·Filed 2008·Granted Apr 5, 2011·6 cites·1 claims
- 1170US7395470B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2005·Granted Jul 1, 2008·4 cites·9 claims
- 1268US7117415B2Automated BIST test pattern sequence generator software system and methodIBM·Filed 2004·Granted Oct 3, 2006·13 cites·18 claims
- 1367US7395469B2Method for implementing deterministic based broken scan chain diagnosticsIBM·Filed 2004·Granted Jul 1, 2008·12 cites·11 claims
- 1465US9244756B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·1 cites·9 claims
- 1563US5640402AFast flush load of LSSD SRL chainsIBM·Filed 1995·Granted Jun 17, 1997·27 cites·7 claims
- 1657US9244757B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·0 cites·11 claims
- 1756US9274173B2Selective test pattern processorIBM·Filed 2014·Granted Mar 1, 2016·0 cites·11 claims
- 1856US7475308B2implementing deterministic based broken scan chain diagnosticsIBM·Filed 2008·Granted Jan 6, 2009·2 cites·7 claims
- 1954US9274172B2Selective test pattern processorIBM·Filed 2013·Granted Mar 1, 2016·0 cites·5 claims
- 2044US2007260926A1Static and dynamic learning test generation methodIBM·Filed 2006·Application pending·0 cites
- 2141US5960114AProcess for identifying and capturing textIBM·Filed 1996·Granted Sep 28, 1999·13 cites·18 claims
- 2239US8065575B2Implementing isolation of VLSI scan chain using ABIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Nov 22, 2011·0 cites·20 claims
- 2339US2009210761A1AC Scan Diagnostic Method and Apparatus Utilizing Functional Architecture Verification PatternsFORLENZA DONATO O·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →