Inventor · disambiguated record
Yoshinao Hirabayashi
Also filed as: HIRABAYASHI YOSHINAO
2 granted patents·1 pending application·5 citations·filing 2001–2009
47Inventor score
Top patents by PatentIndex Score
3 records- 0165US7592586B2Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sampleEBARA CORP·Filed 2004·Granted Sep 22, 2009·5 cites·7 claims
- 0260US8124933B2Mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sampleWATANABE KENJI·Filed 2009·Granted Feb 28, 2012·0 cites·8 claims
- 0332US2003010483A1Plate type heat exchangerFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →