Inventor · disambiguated record

Byound-Sul Kim

Also filed as: KIM BYOUND-SUL

1 granted patent·9 citations·filing 2004–2004

32Inventor score

Technology areasG11C

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0147US7366967B2Methods of testing semiconductor memory devices in a variable CAS latency environment and related semiconductor test devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Apr 29, 2008·9 cites·18 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →