Inventor · disambiguated record
Satya Kurada
Also filed as: KURADA SATYA
4 granted patents·2 pending applications·11 citations·filing 2014–2018
67Inventor score
Files withKLA TENCOR CORP6
Top patents by PatentIndex Score
6 records- 0189US9310320B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2014·Granted Apr 12, 2016·8 cites·33 claims
- 0280US9766187B2Repeater detectionKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·2 cites·22 claims
- 0365US9563943B2Based sampling and binning for yield critical defectsKLA TENCOR CORP·Filed 2016·Granted Feb 7, 2017·1 cites·19 claims
- 0453US2017103517A1Design Based Sampling and Binning for Yield Critical DefectsKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 0545US10620134B2Creating defect samples for array regionsKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·0 cites·21 claims
- 0644US2015120220A1Detecting IC Reliability DefectsKLA TENCOR CORP·Filed 2014·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →