Inventor · disambiguated record
Ariel Ben-Porath
Also filed as: BEN-PORATH ARIEL
10 granted patents·3 pending applications·436 citations·filing 1998–2007
92Inventor score
Files withAPPLIED MATERIALS INC7APPLIED MATERIALS ISRAEL LTD3APPLEID MATERIALS INC1NEHMADI YOUVAL1VASCURE LTD1
Top patents by PatentIndex Score
13 records- 0194US7760929B2Grouping systematic defects with feedback from electrical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·42 cites·10 claims
- 0292US7760347B2Design-based method for grouping systematic defects in lithography pattern writing systemAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·22 cites·7 claims
- 0392US6670610B2System and method for directing a millerAPPLIED MATERIALS INC·Filed 2001·Granted Dec 30, 2003·58 cites·83 claims
- 0490US7135344B2Design-based monitoringAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Nov 14, 2006·62 cites·25 claims
- 0589US7217579B2Voltage contrast test structureAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted May 15, 2007·91 cites·20 claims
- 0686US6922482B1Hybrid invariant adaptive automatic defect classificationAPPLIED MATERIALS INC·Filed 1999·Granted Jul 26, 2005·86 cites·30 claims
- 0779US6987873B1Automatic defect classification with invariant core classesAPPLIED MATERIALS INC·Filed 1998·Granted Jan 17, 2006·57 cites·22 claims
- 0871US6605478B2Kill index analysis for automatic defect classification in semiconductor wafersAPPLEID MATERIALS INC·Filed 2001·Granted Aug 12, 2003·13 cites·22 claims
- 0953US6673657B2Kill index analysis for automatic defect classification in semiconductor wafersAPPLIED MATERIALS INC·Filed 2002·Granted Jan 6, 2004·3 cites·5 claims
- 1045US2009007030A1Design-based monitoringNEHMADI YOUVAL·Filed 2006·Application pending·0 cites
- 1141US2008161840A1Atherectomy methods and apparatusVASCURE LTD·Filed 2007·Application pending·0 cites
- 1241US2003207519A1Kill index analysis for automatic defect classification in semiconductor wafersAPPLIED MATERIALS INC·Filed 2003·Application pending·0 cites
- 1337US7587700B2Process monitoring system and method for processing a large number of sub-micron measurement targetsAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Sep 8, 2009·2 cites·36 claims
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