Inventor · disambiguated record
Jochen Maehliss
Also filed as: MAEHLISS JOCHEN
2 granted patents·1 pending application·3 citations·filing 2007–2010
44Inventor score
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3 records- 0161US7579309B2Methods for characterizing defects on silicon surfaces and etching composition and treatment process thereforSOITEC SILICON ON INSULATOR·Filed 2007·Granted Aug 25, 2009·2 cites·21 claims
- 0253US9063043B2Etching composition, in particular for strained or stressed silicon materials, method for characterizing defects on surfaces of such materials and process of treating such surfaces with the etching compositionABBADIE ALEXANDRA·Filed 2009·Granted Jun 23, 2015·1 cites·18 claims
- 0331US2012094501A1Etching composition, in particular for silicon materials, method for characterizing defects on surfaces of such materials and process of treating such surfaces with the etching compostionMAEHLISS JOCHEN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →