Inventor · disambiguated record
Eric M. Apelgren
Also filed as: APELGREN ERIC · APELGREN ERIC M
11 granted patents·1 pending application·160 citations·filing 1996–2007
90Inventor score
Top patents by PatentIndex Score
12 records- 0191US6261963B1Reverse electroplating of barrier metal layer to improve electromigration performance in copper interconnect devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 17, 2001·62 cites·40 claims
- 0277US6610594B2Locally increasing sidewall density by ion implantationADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 26, 2003·20 cites·45 claims
- 0377US6500755B2Resist trim process to define small openings in dielectric layersADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 31, 2002·18 cites·23 claims
- 0476US6514844B1Sidewall treatment for low dielectric constant (low K) materials by ion implantationADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 4, 2003·21 cites·32 claims
- 0566US6315637B1Photoresist removal using a polishing toolADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 13, 2001·11 cites·17 claims
- 0660US7737021B1Resist trim process to define small openings in dielectric layersGLOBALFOUNDRIES INC·Filed 2002·Granted Jun 15, 2010·6 cites·26 claims
- 0755US6406993B1Method of defining small openings in dielectric layersADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 18, 2002·7 cites·28 claims
- 0851US6313538B1Semiconductor device with partial passivation layerADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 6, 2001·4 cites·9 claims
- 0940US5780861AAdjustable blade reticle assemblyADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 14, 1998·9 cites·23 claims
- 1039US8003306B2Methods of forming electronic devices by ion implantingSPANSION LLC·Filed 2007·Granted Aug 23, 2011·0 cites·20 claims
- 1134US2001051420A1Dielectric formation to seal porosity of low dielectic constant (low k) materials after etchFiled 2000·Application pending·0 cites
- 1231US5848382AMethod for automated energy dose measurement and adjustment for a photoalignerADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 8, 1998·2 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →