Inventor · disambiguated record
Bruce Kim
Also filed as: KIM BRUCE · KIM BRUCE C
8 granted patents·4 pending applications·164 citations·filing 1998–2012
88Inventor score
Top patents by PatentIndex Score
12 records- 0187US6870930B1Methods and systems for TMDS encryptionSILICON IMAGE INC·Filed 2000·Granted Mar 22, 2005·37 cites·13 claims
- 0284US7991096B1Data sampling method and apparatus using through-transition counts to reject worst sampling positionSILICON IMAGE INC·Filed 2004·Granted Aug 2, 2011·21 cites·39 claims
- 0383US7158593B2Combining a clock signal and a data signalSILICON IMAGE INC·Filed 2002·Granted Jan 2, 2007·25 cites·35 claims
- 0476US6111414ASystem, circuit, and method for testing an interconnect in a multi-chip substrateGEORGIA TECH RES INST·Filed 1998·Granted Aug 29, 2000·46 cites·26 claims
- 0570US8742777B2Method and system for testing an electric circuitKIM BRUCE C·Filed 2010·Granted Jun 3, 2014·4 cites·18 claims
- 0670US7236553B1Reduced dead-cycle, adaptive phase tracking method and apparatusSILICON IMAGE INC·Filed 2004·Granted Jun 26, 2007·15 cites·54 claims
- 0766US7062004B1Method and apparatus for adaptive control of PLL loop bandwidthSILICON IMAGE INC·Filed 2001·Granted Jun 13, 2006·11 cites·45 claims
- 0849US7129719B2Apparatus for detecting defect in circuit pattern and defect detecting system having the sameSAMSUNG TECHWIN CO LTD·Filed 2004·Granted Oct 31, 2006·5 cites·19 claims
- 0945US2010235430A1Methods and systems to provide services to a mobile deviceKIM BRUCE·Filed 2009·Application pending·0 cites
- 1039US2012306096A1Method and model of carbon nanotube based through silicon vias (tsv) for rf applicationsKIM BRUCE·Filed 2012·Application pending·0 cites
- 1139US2009105983A1Test definer, a method of automatically determining and representing functional tests for a pcb having analog components and a test systemTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 1235US2005021116A1Electrode for implant in live tissue with flexible region to accommodate micro-movementFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →