Inventor · disambiguated record

Woo Chul Jun

Also filed as: JUN WOO CHUL

1 granted patent·33 citations·filing 1998–1998

45Inventor score

Technology areasG01R

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0163US6236952B1System and method for automatically creating and transmitting test conditions of integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted May 22, 2001·33 cites·14 claims

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