Inventor · disambiguated record
Benjamin Shulman
Also filed as: SHULMAN BENJAMIN
3 granted patents·108 citations·filing 1995–2002
74Inventor score
Technology areasH10P
Files withNOVA MEASURING INSTR LTD3
Top patents by PatentIndex Score
3 records- 0188US6045433AApparatus for optical inspection of wafers during polishingNOVA MEASURING INSTR LTD·Filed 1995·Granted Apr 4, 2000·91 cites·4 claims
- 0262US6964276B2Wafer monitoring systemNOVA MEASURING INSTR LTD·Filed 2002·Granted Nov 15, 2005·12 cites·24 claims
- 0351US6368182B2Apparatus for optical inspection of wafers during polishingNOVA MEASURING INSTR LTD·Filed 2001·Granted Apr 9, 2002·5 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →