Inventor · disambiguated record
Thomas Waayers
Also filed as: WAAYERS THOMAS F · WAAYERS THOMAS FRANCISCUS
6 granted patents·1 pending application·116 citations·filing 2002–2006
82Inventor score
Top patents by PatentIndex Score
7 records- 0189US7620866B2Test access architecture and method of testing a module in an electronic circuitNXP BV·Filed 2005·Granted Nov 17, 2009·21 cites·25 claims
- 0287US7409612B2Testing of integrated circuitsNXP BV·Filed 2004·Granted Aug 5, 2008·62 cites·23 claims
- 0380US6988230B2Test arrangement for assemblages of intergrated circuit blocksKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jan 17, 2006·27 cites·9 claims
- 0444US8410787B2Testing of an integrated circuit with a plurality of clock domainsWAAYERS THOMAS F·Filed 2006·Granted Apr 2, 2013·2 cites·10 claims
- 0542US7571068B2Module, electronic device and evaluation toolNXP BV·Filed 2003·Granted Aug 4, 2009·0 cites·16 claims
- 0642US7124340B2Low pin count, high-speed boundary scan testingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Oct 17, 2006·4 cites·6 claims
- 0730US2004177300A1Apparatus with a test interfaceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →