Inventor · disambiguated record
You-Keun Han
Also filed as: HAN YOU-KEUN
17 granted patents·4 pending applications·82 citations·filing 2005–2014
92Inventor score
Top patents by PatentIndex Score
21 records- 0183US7519873B2Methods and apparatus for interfacing between test system and memorySAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 14, 2009·13 cites·25 claims
- 0282US7965530B2Memory modules and memory systems having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 21, 2011·14 cites·11 claims
- 0379US7487413B2Memory module testing apparatus and method of testing memory modulesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·7 cites·25 claims
- 0478US8159853B2Memory module cutting off DM pad leakage currentKIM SEOK-IL·Filed 2010·Granted Apr 17, 2012·6 cites·16 claims
- 0577US8742780B2Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devicesKIM SEOK-IL·Filed 2010·Granted Jun 3, 2014·5 cites·6 claims
- 0677US7447954B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 4, 2008·8 cites·19 claims
- 0776US7849373B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 7, 2010·2 cites·10 claims
- 0872US8547761B2Memory module and memory system comprising memory moduleKIM SEOK-IL·Filed 2010·Granted Oct 1, 2013·5 cites·19 claims
- 0970US7426149B2Semiconductor memory module and semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 16, 2008·4 cites·26 claims
- 1065US9128817B2Address transforming circuit and semiconductor memory device including the sameKIM SEOK-IL·Filed 2012·Granted Sep 8, 2015·3 cites·12 claims
- 1164US8051343B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Nov 1, 2011·2 cites·15 claims
- 1263US8576637B2Memory module including memory buffer and memory system having the sameJANG SOON-DEOK·Filed 2010·Granted Nov 5, 2013·4 cites·19 claims
- 1363US7814379B2Memory module packaging test systemSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 12, 2010·4 cites·18 claims
- 1461US7606110B2Memory module, memory unit, and hub with non-periodic clock and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 20, 2009·5 cites·20 claims
- 1544US2005289287A1Method and apparatus for interfacing between test system and embedded memory on test mode setting operationSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
- 1644US2013279916A1Server system and method of performing memory hierarchy control in server systemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1742US8462534B2Memory module cutting off DM pad leakage currentKIM SEOK-IL·Filed 2012·Granted Jun 11, 2013·0 cites·15 claims
- 1842US2005183882A1Multi-layer circuit board with thermal diffusion and method of fabricating the sameFiled 2005·Application pending·0 cites
- 1937US9099166B2Memory module and memory system comprising sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 4, 2015·0 cites·20 claims
- 2033US2006059298A1Memory module with memory devices of different capacityCHO JEONG-HYEON·Filed 2005·Application pending·0 cites
- 2129US9164139B2Memory device and memory system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Oct 20, 2015·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →