Inventor · disambiguated record
Hiroki Fujisawa
Also filed as: FUJISAWA HIROKI
158 granted patents·18 pending applications·1,836 citations·filing 1996–2023
99Inventor score
Top patents by PatentIndex Score
176 records- 0198US7215128B2Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuitELPIDA MEMORY INC·Filed 2006·Granted May 8, 2007·57 cites·12 claims
- 0296US8422263B2Load reduced memory module and memory system including the sameSAITO SHUNICHI·Filed 2010·Granted Apr 16, 2013·40 cites·21 claims
- 0395US9865317B2Methods and apparatuses including command delay adjustment circuitMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 9, 2018·19 cites·8 claims
- 0495US8243534B2Semiconductor memory device, memory module including the same, and data processing systemFUJISAWA HIROKI·Filed 2010·Granted Aug 14, 2012·24 cites·20 claims
- 0595US8238175B2Semiconductor memory device, memory module including the same, and data processing systemFUJISAWA HIROKI·Filed 2010·Granted Aug 7, 2012·23 cites·20 claims
- 0695US7826305B2Latency counter, semiconductor memory device including the same, and data processing systemELPIDA MEMORY INC·Filed 2008·Granted Nov 2, 2010·40 cites·23 claims
- 0795US7808270B2Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuitELPIDA MEMORY INC·Filed 2009·Granted Oct 5, 2010·25 cites·11 claims
- 0895US7474550B2Dynamic RAM-and semiconductor deviceELPIDA MEMORY INC·Filed 2007·Granted Jan 6, 2009·23 cites·12 claims
- 0995US6563759B2Semiconductor memory deviceHITACHI LTD·Filed 2001·Granted May 13, 2003·111 cites·25 claims
- 1094US7495453B2Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuitELPIDA MEMORY INC·Filed 2007·Granted Feb 24, 2009·20 cites·35 claims
- 1194US7411852B2Semiconductor memory device and method of adjusting sameELPIDA MEMORY INC·Filed 2006·Granted Aug 12, 2008·37 cites·12 claims
- 1293US11705432B2Stacked die package including a first die coupled to a substrate through direct chip attachment and a second die coupled to the substrate through wire bonding, and related methods and devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 18, 2023·2 cites·18 claims
- 1393US9224451B2Information processing system including semiconductor device having self-refresh modePS4 LUXCO SARL·Filed 2014·Granted Dec 29, 2015·14 cites·16 claims
- 1493US6771552B2Semiconductor memory device and control methodELPIDA MEMORY INC·Filed 2003·Granted Aug 3, 2004·78 cites·6 claims
- 1592US9786352B2Semiconductor memory device including refresh operations having first and second cyclesMICRON TECHNOLOGY INC·Filed 2014·Granted Oct 10, 2017·12 cites·6 claims
- 1692US8198911B2Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuitFUJISAWA HIROKI·Filed 2010·Granted Jun 12, 2012·7 cites·11 claims
- 1792US7541862B2Reference voltage generating circuitELPIDA MEMORY INC·Filed 2006·Granted Jun 2, 2009·21 cites·8 claims
- 1892US6538924B2Semiconductor integrated circuitHITACHI LTD·Filed 2001·Granted Mar 25, 2003·62 cites·12 claims
- 1991US7656186B2Calibration circuit, semiconductor device including the same, and data processing systemELPIDA MEMORY INC·Filed 2008·Granted Feb 2, 2010·16 cites·7 claims
- 2090US7580321B2Synchronous semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Aug 25, 2009·21 cites·11 claims
- 2190US7477083B2DLL circuit feeding back ZQ calibration result, and semiconductor device incorporating the sameELPIDA MEMORY INC·Filed 2006·Granted Jan 13, 2009·25 cites·18 claims
- 2290US7426144B2Semiconductor storage deviceELPIDA MEMORY INC·Filed 2006·Granted Sep 16, 2008·22 cites·12 claims
- 2390US7345950B2Synchronous semiconductor memory deviceELPIDA MEMORY INC·Filed 2006·Granted Mar 18, 2008·22 cites·8 claims
- 2490US6512719B2Semiconductor memory device capable of outputting and inputting data at high speedHITACHI LTD·Filed 2001·Granted Jan 28, 2003·59 cites·23 claims
- 2589US7994812B2Calibration circuit, semiconductor device including the same, and data processing systemELPIDA MEMORY INC·Filed 2009·Granted Aug 9, 2011·13 cites·13 claims
- 2688US10957681B1Integrated assemblies comprising sense-amplifier-circuitry and wordline-driver-circuitry under memory cells of a memory arrayMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 23, 2021·4 cites·5 claims
- 2788US7612579B2Output circuit of semiconductor device and semiconductor device including thereofELPIDA MEMORY INC·Filed 2007·Granted Nov 3, 2009·19 cites·15 claims
- 2887US8270228B2Semiconductor device having nonvolatile memory element and data processing system including the sameMIZUKANE YOSHIO·Filed 2010·Granted Sep 18, 2012·14 cites·20 claims
- 2987US7902858B2Calibration circuit, semiconductor device including the same, and memory moduleELPIDA MEMORY INC·Filed 2008·Granted Mar 8, 2011·22 cites·17 claims
- 3087US6411543B2Dynamic random access memory (RAM), semiconductor storage device, and semiconductor integrated circuit (IC) deviceHITACHI LTD·Filed 2001·Granted Jun 25, 2002·43 cites·18 claims
- 3186US8630129B2Semiconductor device having plural banksFUJISAWA HIROKI·Filed 2011·Granted Jan 14, 2014·13 cites·19 claims
- 3286US7750726B2Reference voltage generating circuitELPIDA MEMORY INC·Filed 2008·Granted Jul 6, 2010·13 cites·12 claims
- 3385US7595645B2Calibration circuit and semiconductor device incorporating the sameELPIDA MEMORY INC·Filed 2006·Granted Sep 29, 2009·13 cites·24 claims
- 3485US6201728B1Dynamic RAM, semiconductor storage device, and semiconductor integrated circuit deviceHITACHI LTD·Filed 1996·Granted Mar 13, 2001·60 cites·23 claims
- 3584US8699256B2Semiconductor device having nonvolatile memory elementsKUBOUCHI SHUICHI·Filed 2010·Granted Apr 15, 2014·10 cites·32 claims
- 3684US8208340B2Latency counter, semiconductor memory device including the same, and data processing systemFUJISAWA HIROKI·Filed 2010·Granted Jun 26, 2012·9 cites·16 claims
- 3784US6584031B2Semiconductor integrated circuit deviceHITACHI LTD·Filed 2002·Granted Jun 24, 2003·26 cites·3 claims
- 3884US6373776B2Dynamic ram and semiconductor deviceHITACHI LTD·Filed 2001·Granted Apr 16, 2002·21 cites·7 claims
- 3984US6370054B1Dynamic RAM and semiconductor deviceHITACHI LTD·Filed 2000·Granted Apr 9, 2002·21 cites·17 claims
- 4083US11227861B2Integrated assemblies comprising sense-amplifier-circuitry and wordline-driver-circuitry under memory cells of a memory arrayMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 18, 2022·1 cites·8 claims
- 4183US6667905B2Semiconductor integrated circuitHITACHI LTD·Filed 2003·Granted Dec 23, 2003·29 cites·6 claims
- 4283US6388941B2Semiconductor deviceHITACHI LTD·Filed 2001·Granted May 14, 2002·33 cites·13 claims
- 4383US6195305B1Semiconductor integrated circuit deviceHITACHI LTD·Filed 1999·Granted Feb 27, 2001·40 cites·16 claims
- 4482US9641175B2Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuitPS4 LUXCO SARL·Filed 2016·Granted May 2, 2017·2 cites·30 claims
- 4582US7184323B24N pre-fetch memory data transfer systemELPIDA MEMORY INC·Filed 2004·Granted Feb 27, 2007·32 cites·11 claims
- 4682US6639822B2Dynamic ram-and semiconductor deviceHITACHI LTD·Filed 2003·Granted Oct 28, 2003·18 cites·2 claims
- 4781US8553489B2Semiconductor device having point-shift type FIFO circuitFUJISAWA HIROKI·Filed 2011·Granted Oct 8, 2013·9 cites·21 claims
- 4881US7688671B2Semiconductor memory chip with on-die termination functionELPIDA MEMORY INC·Filed 2006·Granted Mar 30, 2010·14 cites·18 claims
- 4981US6665203B2Semiconductor memory device having a hierarchial I/O strucutureHITACHI LTD·Filed 2001·Granted Dec 16, 2003·27 cites·3 claims
- 5080US9043539B2Semiconductor device having a memory and calibration circuit that selectively adjusts an impedance of an output buffer dependent upon refresh commandsKAIWA NAKABA·Filed 2010·Granted May 26, 2015·7 cites·18 claims
Showing the top 50 of 176 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →