Inventor · disambiguated record
Bernd Koenemann
Also filed as: KOENEMANN BERND · KOENEMANN BERND K · KOENEMANN BERND K F · KOENEMANN BERND KARL FERDINAND
12 granted patents·1 pending application·469 citations·filing 1993–2009
93Inventor score
Top patents by PatentIndex Score
13 records- 0193US7509551B2Direct logic diagnostics with signature-based fault dictionariesKOENEMANN BERND·Filed 2006·Granted Mar 24, 2009·35 cites·42 claims
- 0293US6611933B1Real-time decoder for scan test patternsIBM·Filed 2000·Granted Aug 26, 2003·83 cites·16 claims
- 0393US5612963AHybrid pattern self-testing of integrated circuitsIBM·Filed 1995·Granted Mar 18, 1997·108 cites·13 claims
- 0492US6041429ASystem for test data storage reductionIBM·Filed 1993·Granted Mar 21, 2000·95 cites·4 claims
- 0584US6782501B2System for reducing test data volume in the testing of logic productsCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Aug 24, 2004·34 cites·18 claims
- 0682US6708305B1Deterministic random LBISTIBM·Filed 2000·Granted Mar 16, 2004·29 cites·20 claims
- 0781US7725849B2Feature failure correlationMENTOR GRAPHICS CORP·Filed 2005·Granted May 25, 2010·12 cites·50 claims
- 0875US8166360B2Direct logic diagnostics with signature-based fault dictionariesKOENEMANN BERND·Filed 2009·Granted Apr 24, 2012·7 cites·22 claims
- 0967US5617426AClocking mechanism for delay, short path and stuck-at testingIBM·Filed 1995·Granted Apr 1, 1997·32 cites·2 claims
- 1063US7435990B2Arrangement for testing semiconductor chips while incorporated on a semiconductor waferIBM·Filed 2003·Granted Oct 14, 2008·7 cites·5 claims
- 1163US5375091AMethod and apparatus for memory dynamic burn-in and testIBM·Filed 1993·Granted Dec 20, 1994·23 cites·22 claims
- 1246US7103816B2Method and system for reducing test data volume in the testing of logic productsCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Sep 5, 2006·4 cites·6 claims
- 1334US2004139377A1Method and apparatus for compact scan testingIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →