Inventor · disambiguated record
Jason Osborne
Also filed as: OSBORNE JASON · OSBORNE JASON R
8 granted patents·20 citations·filing 2005–2021
80Inventor score
Top patents by PatentIndex Score
8 records- 0185US7665349B2Method and apparatus for rapid automatic engagement of a probeVEECO INSTR INC·Filed 2005·Granted Feb 23, 2010·13 cites·36 claims
- 0279US11796565B2AFM imaging with metrology-preserving real time denoisingBRUKER NANO INC·Filed 2021·Granted Oct 24, 2023·1 cites·15 claims
- 0376US10969406B2High speed atomic force profilometry of large areasBRUKER NANO INC·Filed 2019·Granted Apr 6, 2021·1 cites·19 claims
- 0470US9995763B2Precise probe placement in automated scanning probe microscopy systemsBRUKER NANO INC·Filed 2015·Granted Jun 12, 2018·2 cites·23 claims
- 0564US11668730B2High speed atomic force profilometry of large areasBRUKER NANO INC·Filed 2021·Granted Jun 6, 2023·0 cites·7 claims
- 0655US11714104B2AFM imaging with creep correctionBRUKER NANO INC·Filed 2021·Granted Aug 1, 2023·0 cites·16 claims
- 0755US11604210B2AFM imaging with real time drift correctionBRUKER NANO INC·Filed 2021·Granted Mar 14, 2023·0 cites·15 claims
- 0850US7429732B2Scanning probe microscopy method and apparatus utilizing sample pitchVEECO INSTR INC·Filed 2005·Granted Sep 30, 2008·3 cites·32 claims
Join the waitlist — get patent alerts
Get an alert when Jason Osborne files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →