Inventor · disambiguated record
Masayuki Kuwabara
Also filed as: KUWABARA MASAYUKI
17 granted patents·5 pending applications·347 citations·filing 1991–2021
94Inventor score
Files withTOKYO SEIMITSU CO LTD9EASTMAN KODAK CO4HITACHI HIGH TECH CORP2PANASONIC IP MAN CO LTD2SAKAI KAORU2
Top patents by PatentIndex Score
22 records- 0194US6580502B1Appearance inspection method and apparatusTOKYO SEIMITSU CO LTD·Filed 2000·Granted Jun 17, 2003·84 cites·13 claims
- 0291US5113232ALED array chips with thermal conductorEASTMAN KODAK CO·Filed 1991·Granted May 12, 1992·108 cites·10 claims
- 0377US6512843B1Pattern comparison method and appearance inspection machine for performance comparison based on double detection without delayTOKYO SEIMITSU CO LTD·Filed 1999·Granted Jan 28, 2003·41 cites·6 claims
- 0476US5240335ABraille printing apparatusEASTMAN KODAK CO·Filed 1992·Granted Aug 31, 1993·22 cites·7 claims
- 0575US8090187B2Pattern inspection method and its apparatusSAKAI KAORU·Filed 2010·Granted Jan 3, 2012·3 cites·7 claims
- 0675US7711178B2Pattern inspection method and its apparatusHITACHI LTD·Filed 2007·Granted May 4, 2010·5 cites·16 claims
- 0771US9743568B2Reel for component mounting apparatus and component supplying method in component mounting apparatusPANASONIC CORP·Filed 2014·Granted Aug 22, 2017·2 cites·6 claims
- 0869US6973208B2Method and apparatus for inspection by pattern comparisonTOKYO SEIMITSU CO LTD·Filed 2001·Granted Dec 6, 2005·10 cites·14 claims
- 0968US9227387B2Electronic component mounting system, electronic component mounting method, and electronic component mounting machinePANASONIC IP MAN CO LTD·Filed 2014·Granted Jan 5, 2016·1 cites·9 claims
- 1067US7248732B2Pattern inspection method and inspection apparatusTOKYO SEIMITSU CO LTD·Filed 2003·Granted Jul 24, 2007·13 cites·4 claims
- 1165US6980686B2Pattern inspection method and inspection apparatusTOKYO SEIMITSU CO LTD·Filed 2002·Granted Dec 27, 2005·10 cites·24 claims
- 1258US2023333133A1Automatic analysis deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1355US6229331B1Apparatus for and method of inspecting patterns on semiconductor integrated devicesTOKYO SEIMITSU CO LTD·Filed 1999·Granted May 8, 2001·18 cites·6 claims
- 1453US5189496ALight-emitting diode with current-blockingEASTMAN KODAK CO·Filed 1991·Granted Feb 23, 1993·15 cites·10 claims
- 1553US2023341431A1Automatic analyzer and analysis methodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1651US9572295B2Electronic component mounting system, electronic component mounting method, and electronic component mounting machinePANASONIC IP MAN CO LTD·Filed 2015·Granted Feb 14, 2017·0 cites·4 claims
- 1751US2012076396A1Pattern inspection method and its apparatusSAKAI KAORU·Filed 2011·Application pending·0 cites
- 1844US6643394B1Visual inspection apparatus and methodTOKYO SEIMITSU CO LTD·Filed 1999·Granted Nov 4, 2003·9 cites·5 claims
- 1942US2004047501A1Visual inspection apparatus and methodTOKYO SEIMITSU CO LTD·Filed 2003·Application pending·0 cites
- 2042US2003179921A1Pattern inspection method and its apparatusFiled 2003·Application pending·0 cites
- 2137US6650769B1Review station and appearance inspection device for checking semiconductor wafersTOKYO SEIMITSU CO LTD·Filed 1999·Granted Nov 18, 2003·5 cites·4 claims
- 2230US5760460ALight-emitting diode arrayEASTMAN KODAK CO·Filed 1993·Granted Jun 2, 1998·1 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →