Assignee
SAKAI KAORU
JP·8 granted patents·9 pending applications·44 citations·filing 2008–2012
Top patents by PatentIndex Score
17 records- 0193US8275190B2Method and apparatus for inspecting pattern defectsSAKAI KAORU·Filed 2011·Granted Sep 25, 2012·13 cites·10 claims
- 0286US8639019B2Method and apparatus for inspecting pattern defectsSAKAI KAORU·Filed 2012·Granted Jan 28, 2014·6 cites·8 claims
- 0384US8467594B2Method and apparatus for inspecting patterns formed on a substrateSAKAI KAORU·Filed 2010·Granted Jun 18, 2013·6 cites·6 claims
- 0478US8340395B2Defect inspection method and apparatus thereforSAKAI KAORU·Filed 2009·Granted Dec 25, 2012·12 cites·8 claims
- 0575US8090187B2Pattern inspection method and its apparatusSAKAI KAORU·Filed 2010·Granted Jan 3, 2012·3 cites·7 claims
- 0668US8270700B2Method and apparatus for pattern inspectionSAKAI KAORU·Filed 2009·Granted Sep 18, 2012·3 cites·12 claims
- 0761US8737718B2Apparatus and method for inspecting defectSAKAI KAORU·Filed 2010·Granted May 27, 2014·1 cites·8 claims
- 0861US8216044B1Method and apparatus for calculating game outcomesSAKAI KAORU·Filed 2008·Granted Jul 10, 2012·0 cites·20 claims
- 0953US2011311126A1Defect inspecting apparatus and defect inspecting methodSAKAI KAORU·Filed 2009·Application pending·0 cites
- 1052US2011182496A1Defect check method and device thereofSAKAI KAORU·Filed 2009·Application pending·0 cites
- 1151US2009169093A1Pattern inspection method and its apparatusSAKAI KAORU·Filed 2009·Application pending·0 cites
- 1251US2013002849A1Method and apparatus for pattern inspectionSAKAI KAORU·Filed 2012·Application pending·0 cites
- 1351US2012076396A1Pattern inspection method and its apparatusSAKAI KAORU·Filed 2011·Application pending·0 cites
- 1451US2009226076A1Pattern inspection method and its apparatusSAKAI KAORU·Filed 2009·Application pending·0 cites
- 1544US2008292176A1Pattern inspection method and pattern inspection apparatusSAKAI KAORU·Filed 2008·Application pending·0 cites
- 1639US2013329039A1Defect inspection method and device thereofSAKAI KAORU·Filed 2011·Application pending·0 cites
- 1738US2012294507A1Defect inspection method and device thereofSAKAI KAORU·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →