Inventor · disambiguated record
Kenneth F. Hollman
Also filed as: HOLLMAN KENNETH · HOLLMAN KENNETH F
16 granted patents·1 pending application·989 citations·filing 1981–2007
96Inventor score
Files withMICROMANIPULATOR COMPANY INC11MICROMANIPULATOR CO INC3HANCOCK ROBERT DEAN1MICROMANIPULATOR COMPANY1PROBING SOLUTIONS INC1
Top patents by PatentIndex Score
17 records- 0197US6744268B2High resolution analytical probe stationMICROMANIPULATOR COMPANY INC·Filed 2002·Granted Jun 1, 2004·168 cites·15 claims
- 0296US6198299B1High Resolution analytical probe stationMICROMANIPULATOR COMPANY INC·Filed 1998·Granted Mar 6, 2001·133 cites·20 claims
- 0395US4893914ATest stationMICROMANIPULATOR COMPANY INC·Filed 1988·Granted Jan 16, 1990·207 cites·17 claims
- 0494US6917195B2Wafer probe stationMICROMANIPULATOR COMPANY INC·Filed 2004·Granted Jul 12, 2005·61 cites·5 claims
- 0593US6424141B1Wafer probe stationMICROMANIPULATOR COMPANY INC·Filed 2000·Granted Jul 23, 2002·87 cites·25 claims
- 0692US6191598B1High resolution analytical probe stationMICROMANIPULATOR COMPANY INC·Filed 2000·Granted Feb 20, 2001·35 cites·20 claims
- 0790US7180317B2High resolution analytical probe stationMICROMANIPULATOR CO INC·Filed 2004·Granted Feb 20, 2007·42 cites·20 claims
- 0889US4607220AMethod and apparatus for low temperature testing of electronic componentsMICROMANIPULATOR CO INC·Filed 1984·Granted Aug 19, 1986·55 cites·1 claims
- 0988US6621282B2High resolution analytical probe stationMICROMANIPULATOR COMPANY INC·Filed 2001·Granted Sep 16, 2003·31 cites·18 claims
- 1085US7043848B2Method and apparatus for maintaining accurate positioning between a probe and a DUTMICROMANIPULATOR COMPANY·Filed 2004·Granted May 16, 2006·59 cites·32 claims
- 1182US4956923AProbe assembly including touchdown sensorMICROMANIPULATOR CO INC·Filed 1989·Granted Sep 18, 1990·44 cites·10 claims
- 1270US6838895B2High resolution analytical probe stationMICROMANIPULATOR COMPANY INC·Filed 2003·Granted Jan 4, 2005·10 cites·22 claims
- 1368US6700397B2Triaxial probe assemblyMICROMANIPULATOR COMPANY INC·Filed 2001·Granted Mar 2, 2004·14 cites·23 claims
- 1458US6803756B2Wafer probe stationMICROMANIPULATOR COMPANY INC·Filed 2002·Granted Oct 12, 2004·7 cites·25 claims
- 1554US4466746AEbulliometric hot spot detectorHANCOCK ROBERT DEAN·Filed 1981·Granted Aug 21, 1984·14 cites·22 claims
- 1653US5783835AProbing with backside emission microscopyPROBING SOLUTIONS INC·Filed 1997·Granted Jul 21, 1998·22 cites·20 claims
- 1753US2007290703A1High Resolution Analytical Probe StationMICROMANIPULATOR COMPANY INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →