Inventor · disambiguated record
Dong Seok Baek
Also filed as: BAEK DONG SEOK
7 granted patents·8 pending applications·8 citations·filing 2004–2017
76Inventor score
Top patents by PatentIndex Score
15 records- 0173US8327534B2Method of fabricating printed circuit board assemblyPARK MIN YOUNG·Filed 2010·Granted Dec 11, 2012·3 cites·12 claims
- 0270US8314920B2Method of aligning an exposure apparatus, method of exposing a photoresist film using the same and exposure apparatus for performing the method of exposing a photoresist filmPARK SANG-HYUN·Filed 2009·Granted Nov 20, 2012·2 cites·19 claims
- 0367US7446555B2Apparatus to inspect TFT substrate and method of inspecting TFT substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 4, 2008·2 cites·21 claims
- 0459US8804098B2Maskless exposure apparatus having measurement optical unit to measure depths of focus of a plurality of beams and control method thereofBAEK DONG SEOK·Filed 2010·Granted Aug 12, 2014·1 cites·17 claims
- 0556US9329504B2Method of aligning an exposure apparatus, method of exposing a photoresist film using the same and exposure apparatus for performing the method of exposing a photoresist filmSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted May 3, 2016·0 cites·11 claims
- 0648US2010097591A1Exposure apparatuses and methodsSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 0745US8994922B2Lens barrel support device and maskless exposure apparatus having the samePARK SANG HYUN·Filed 2010·Granted Mar 31, 2015·0 cites·20 claims
- 0844US8427712B2Exposure apparatuses and methods to compress exposure dataCHOI HO SEOK·Filed 2009·Granted Apr 23, 2013·0 cites·20 claims
- 0944US2008149830A1Ameliorating charge trap in inspecting samples using scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1038US2011181856A1Auto-focusing device and method for maskless exposure apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2011·Application pending·0 cites
- 1138US2005014382A1Etching apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 1238US2011149297A1Maskless exposure apparatus and multi-head alignment method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
- 1337US2018366358A1Semiconductor processing equipment alignment apparatus and methods using reflected light measurementsSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
- 1433US2011149301A1Beam position measuring apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
- 1530US2007153262A1Inspecting apparatus and methodBAEK DONG-SEOK·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →