Inventor · disambiguated record
Robert Andrew Bardos
Also filed as: BARDOS ROBERT A · BARDOS ROBERT ANDREW
12 granted patents·5 pending applications·42 citations·filing 2006–2016
89Inventor score
Top patents by PatentIndex Score
17 records- 0187US8064054B2Method and system for inspecting indirect bandgap semiconductor structureTRUPKE THORSTEN·Filed 2006·Granted Nov 22, 2011·11 cites·112 claims
- 0286US8710860B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingTRUPKE THORSTEN·Filed 2007·Granted Apr 29, 2014·8 cites·30 claims
- 0385US9482625B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingBT IMAGING PTY LTD·Filed 2014·Granted Nov 1, 2016·4 cites·16 claims
- 0482US9546955B2Wafer imaging and processing method and apparatusBT IMAGING PTY LTD·Filed 2015·Granted Jan 17, 2017·3 cites·29 claims
- 0579US9035267B2In-line photoluminescence imaging of semiconductor devicesMAXWELL IAN A·Filed 2011·Granted May 19, 2015·5 cites·65 claims
- 0678US9912291B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingBT IMAGING PTY LTD·Filed 2016·Granted Mar 6, 2018·1 cites·14 claims
- 0771US9103792B2Wafer imaging and processing method and apparatusTRUPKE THORSTEN·Filed 2009·Granted Aug 11, 2015·3 cites·20 claims
- 0871US7919762B2Determining diffusion length of minority carriers using luminescenceBT IMAGING PTY LTD·Filed 2007·Granted Apr 5, 2011·4 cites·18 claims
- 0967US9234849B2Method and system for inspecting indirect bandgap semiconductor structureTRUPKE THORSTEN·Filed 2012·Granted Jan 12, 2016·1 cites·32 claims
- 1067US8218140B2Method and system for inspecting indirect bandgap semiconductor stuctureTRUPKE THORSTEN·Filed 2011·Granted Jul 10, 2012·1 cites·112 claims
- 1160US8483476B2Photovoltaic cell manufacturingBARDOS ROBERT ANDREW·Filed 2008·Granted Jul 9, 2013·1 cites·38 claims
- 1256US9909991B2Method and system for inspecting indirect bandgap semiconductor structureBT IMAGING PTY LTD·Filed 2016·Granted Mar 6, 2018·0 cites·32 claims
- 1351US2015219560A1In-line photoluminescence imaging of semiconductor devicesBT IMAGING PTY LTD·Filed 2015·Application pending·0 cites
- 1448US2018159469A1Determining the condition of photovoltaic modulesBT IMAGING PTY LTD·Filed 2016·Application pending·0 cites
- 1548US2011117681A1Thin film imaging method and apparatusBT IMAGING PTY LTD·Filed 2009·Application pending·0 cites
- 1641US2018159468A1Determining the condition of photovoltaic modulesBT IMAGING PTY LTD·Filed 2016·Application pending·0 cites
- 1740US2012142125A1Photoluminescence imaging systems for silicon photovoltaic cell manufacturingTRUPKE THORSTEN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →