Inventor · disambiguated record
Eugene A. Delenia
Also filed as: DELENIA EUGENE · DELENIA EUGENE A
4 granted patents·29 citations·filing 1991–2004
73Inventor score
Top patents by PatentIndex Score
4 records- 0155US7029595B1Selective etch for uniform metal trace exposure and milling using focused ion beam systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 18, 2006·5 cites·16 claims
- 0252US7036109B1Imaging integrated circuits with focused ion beamCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·2 cites·29 claims
- 0349US7245133B2Integration of photon emission microscope and focused ion beamCREDENCE SYSTEMS CORP·Filed 2004·Granted Jul 17, 2007·5 cites·52 claims
- 0443US5290588ATiW barrier metal processADVANCED MICRO DEVICES INC·Filed 1991·Granted Mar 1, 1994·17 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →