Inventor · disambiguated record
Samy R. Makar
Also filed as: MAKAR SAMY · MAKAR SAMY R
5 granted patents·2 pending applications·63 citations·filing 2005–2013
78Inventor score
Technology areasG01R
Top patents by PatentIndex Score
7 records- 0193US7263642B1Testing replicated sub-systems in a yield-enhancing chip-test environment using on-chip compare to expected results for parallel scan chains testing critical and repairable sections of each sub-systemAZUL SYSTEMS INC·Filed 2005·Granted Aug 28, 2007·39 cites·22 claims
- 0285US8495443B1Secure register scan bypassYU JIANLIN·Filed 2011·Granted Jul 23, 2013·9 cites·25 claims
- 0383US8301947B1Dynamic scan chain groupingMAKAR SAMY·Filed 2011·Granted Oct 30, 2012·13 cites·25 claims
- 0466US9234942B2Transition fault testing of source synchronous interfaceAPPLE INC·Filed 2012·Granted Jan 12, 2016·2 cites·25 claims
- 0543US8793545B2Apparatus and method for clock glitch detection during at-speed testingRAMASWAMI RAVI K·Filed 2012·Granted Jul 29, 2014·0 cites·20 claims
- 0640US2015046763A1Apparatus and Method for Controlling Internal Test ControllersAPPLE INC·Filed 2013·Application pending·0 cites
- 0736US2011022907A1FPGA Test Configuration MinimizationSTARDFX TECHNOLOGIES INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →