Inventor · disambiguated record
Oluwamuyiwa Oluwagbemiga Olubuyide
Also filed as: OLUBUYIDE OLUWAMUYIWA OLUWAGBEMIGA
3 granted patents·1 pending application·5 citations·filing 2010–2010
57Inventor score
Top patents by PatentIndex Score
4 records- 0169US8669775B2Scribe line test modules for in-line monitoring of context dependent effects for ICs including MOS devicesCHOI YOUN SUNG·Filed 2010·Granted Mar 11, 2014·3 cites·16 claims
- 0266US8664968B2On-die parametric test modules for in-line monitoring of context dependent effectsBALDWIN GREGORY CHARLES·Filed 2010·Granted Mar 4, 2014·2 cites·16 claims
- 0342US8438526B2Method for minimizing transistor and analog component variation in CMOS processes through design rule restrictionsBALDWIN GREGORY CHARLES·Filed 2010·Granted May 7, 2013·0 cites·15 claims
- 0429US2012143569A1Automated Extraction of Size-Dependent Layout Parameters for Transistor ModelsOLUBUYIDE OLUWAMUYIWA OLUWAGBEMIGA·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Oluwamuyiwa Oluwagbemiga Olubuyide files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →