Inventor · disambiguated record
Peter Statham
Also filed as: STATHAM PETER · STATHAM PETER J · STATHAM PETER JOHN
16 granted patents·4 pending applications·137 citations·filing 1993–2025
91Inventor score
Files withOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD9OXFORD INSTR NANOTECHNOLOGY TOOLS LTD4STATHAM PETER JOHN3OXFORD INSTR ANALYTICAL LTD2BARKSHIRE IAN RICHARD1
Top patents by PatentIndex Score
20 records- 0192US7595489B2Method and apparatus for material identificationOXFORD INSTR ANALYTICAL LTD·Filed 2006·Granted Sep 29, 2009·26 cites·32 claims
- 0285US5357110AVisual color mapping X-ray analysis apparatusLINK ANALYTICAL LTD·Filed 1993·Granted Oct 18, 1994·72 cites·16 claims
- 0379US8222598B2Method for quantitative analysis of a materialSTATHAM PETER JOHN·Filed 2008·Granted Jul 17, 2012·8 cites·15 claims
- 0478US8346521B2Method of determining the feasibility of a proposed structure analysis processOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2007·Granted Jan 1, 2013·8 cites·35 claims
- 0577US8065094B2Method of calculating the structure of an inhomogeneous sampleSTATHAM PETER JOHN·Filed 2008·Granted Nov 22, 2011·6 cites·31 claims
- 0674US8890065B2Apparatus and method for performing microdiffraction analysisOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2012·Granted Nov 18, 2014·3 cites·30 claims
- 0774US7533000B2Method and apparatus for analysing a dataset of spectraOXFORD INSTR ANALYTICAL LTD·Filed 2006·Granted May 12, 2009·9 cites·31 claims
- 0863US8421027B2Charged particle analyser and method using electrostatic filter grids to filter charged particlesBARKSHIRE IAN RICHARD·Filed 2008·Granted Apr 16, 2013·3 cites·37 claims
- 0962US2025087449A1Electron FilterOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2024·Application pending·0 cites
- 1061US11688582B2Navigation for electron microscopyOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2018·Granted Jun 27, 2023·1 cites·27 claims
- 1157US10354834B2X-ray analysis in airOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2017·Granted Jul 16, 2019·0 cites·20 claims
- 1257US9704688B2X-ray analysis in airOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2014·Granted Jul 11, 2017·0 cites·19 claims
- 1356US10354414B2Material identification using multiple imagesSTATHAM PETER JOHN·Filed 2011·Granted Jul 16, 2019·1 cites·21 claims
- 1456US2025314603A1Method of obtaining a modified image of a specimenOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2025·Application pending·0 cites
- 1550US9704689B2Method of reducing the thickness of a target sampleOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2014·Granted Jul 11, 2017·0 cites·40 claims
- 1650US2023175991A1Improved camera for electron diffraction pattern analysisOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2021·Application pending·0 cites
- 1745US2024339293A1Improved navigation for electron microscopyOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2022·Application pending·0 cites
- 1844US10018737B2Method of processing a particle spectrumOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2014·Granted Jul 10, 2018·0 cites·13 claims
- 1941US11195692B2System for electron diffraction analysisOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2018·Granted Dec 7, 2021·0 cites·19 claims
- 2036US10054557B2Method for measuring the mass thickness of a target sample for electron microscopyOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2015·Granted Aug 21, 2018·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →