Inventor · disambiguated record
Chih-Peng Hsieh
Also filed as: HSIEH CHIH-PENG
13 granted patents·4 pending applications·6 citations·filing 2017–2024
82Inventor score
Top patents by PatentIndex Score
17 records- 0188US10613117B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Apr 7, 2020·4 cites·10 claims
- 0273US10605830B2Probe card device and rectangular probe thereof having ring-shaped branch segmentCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Mar 31, 2020·1 cites·11 claims
- 0368US10317429B2Bolt type probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Jun 11, 2019·1 cites·10 claims
- 0455US12422456B2Probe cardUNIMICRON TECHNOLOGY CORP·Filed 2024·Granted Sep 23, 2025·0 cites·10 claims
- 0555US12108530B2Circuit board structure and manufacturing method thereofUNIMICRON TECHNOLOGY CORP·Filed 2022·Granted Oct 1, 2024·0 cites·4 claims
- 0649US10509057B2Probe assembly and probe structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·22 claims
- 0748US10514390B2Probe structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Dec 24, 2019·0 cites·16 claims
- 0847US9970960B2Sliding rail type probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted May 15, 2018·0 cites·13 claims
- 0947US2025172588A1Probe cardUNIMICRON TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1043US11041883B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Jun 22, 2021·0 cites·6 claims
- 1143US10901001B2Probe card device and probe headCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Jan 26, 2021·0 cites·6 claims
- 1241US10670630B2Probe card device and rectangular probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Jun 2, 2020·0 cites·9 claims
- 1341US10615768B2Probe assembly and capacitive space transformer thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Apr 7, 2020·0 cites·11 claims
- 1441US10401388B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Sep 3, 2019·0 cites·10 claims
- 1539US2019101568A1Probe assembly and capacitive probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Application pending·0 cites
- 1639US2019137544A1Probe assembly and engaged-type capacitive probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Application pending·0 cites
- 1738US2019086443A1Probe card device and round probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →