Inventor · disambiguated record
R. Tim Frodsham
Also filed as: FRODSHAM R TIM
5 granted patents·262 citations·filing 1995–1999
85Inventor score
Files withINTEL CORP5
Top patents by PatentIndex Score
5 records- 0190US6477674B1Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elementsINTEL CORP·Filed 1999·Granted Nov 5, 2002·105 cites·37 claims
- 0283US6629274B1Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output bufferINTEL CORP·Filed 1999·Granted Sep 30, 2003·56 cites·20 claims
- 0374US6262585B1Apparatus for I/O leakage self-test in an integrated circuitINTEL CORP·Filed 1999·Granted Jul 17, 2001·38 cites·23 claims
- 0455US5654988AApparatus for generating a pulse clock signal for a multiple-stage synchronizerINTEL CORP·Filed 1995·Granted Aug 5, 1997·43 cites·10 claims
- 0543US6477657B1Circuit for I/O clock generationINTEL CORP·Filed 1999·Granted Nov 5, 2002·20 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →