Inventor · disambiguated record
Vladimir Lobastov
Also filed as: LOBASTOV VLADIMIR · LOBASTOV VLADIMIR A · LOBASTOV VLADIMIR ANATOLIEVICH
8 granted patents·7 pending applications·112 citations·filing 2005–2023
87Inventor score
Top patents by PatentIndex Score
15 records- 0196US7154091B2Method and system for ultrafast photoelectron microscopeCALIFORNIA INST OF TECHN·Filed 2005·Granted Dec 26, 2006·45 cites·81 claims
- 0294US7442931B2Method and system for ultrafast photoelectron microscopeCALIFORNIA INST OF TECHN·Filed 2006·Granted Oct 28, 2008·24 cites·20 claims
- 0393US8824635B2Detector modules for imaging systems and methods of manufacturingTKACZYK JOHN ERIC·Filed 2011·Granted Sep 2, 2014·16 cites·20 claims
- 0489US7915583B2Method and system for ultrafast photoelectron microscopeCALIFORNIA INST OF TECHN·Filed 2008·Granted Mar 29, 2011·10 cites·54 claims
- 0584US11413698B2System and method for monitoring and controlling build quality during electron beam manufacturingGEN ELECTRIC·Filed 2018·Granted Aug 16, 2022·2 cites·20 claims
- 0683US10117626B2Apparatus and method for pile-up correction in photon-counting detectorGEN ELECTRIC·Filed 2015·Granted Nov 6, 2018·5 cites·18 claims
- 0781US10502701B2Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing processGEN ELECTRIC·Filed 2018·Granted Dec 10, 2019·1 cites·19 claims
- 0877US9220469B2Systems and methods for correcting detector errors in computed tomography imagingGEN ELECTRIC·Filed 2013·Granted Dec 29, 2015·9 cites·20 claims
- 0963US2025020600A1Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured componentGEN ELECTRIC·Filed 2023·Application pending·0 cites
- 1054US2013161523A1Radiation detector with voltage-biased focus gridTKACZYK JOHN ERIC·Filed 2011·Application pending·0 cites
- 1142US2013049151A1Anode-illuminated radiation detectorLOBASTOV VLADIMIR A·Filed 2011·Application pending·0 cites
- 1241US2014348290A1Apparatus and Method for Low Capacitance Packaging for Direct Conversion X-Ray or Gamma Ray DetectorGEN ELECTRIC·Filed 2013·Application pending·0 cites
- 1341US2015092912A1Systems and methods for filtering emissions from scintillatorsGEN ELECTRIC·Filed 2013·Application pending·0 cites
- 1439US2012080414A1Method and system for laser patterning a semiconductor substrateZHANG WENWU·Filed 2010·Application pending·0 cites
- 1537US2012193545A1Detector systems with anode incidence face and methods of fabricating the sameTKACZYK JOHN ERIC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →