Inventor · disambiguated record
Che-Yen Lee
Also filed as: LEE CHE-YEN
2 granted patents·2 pending applications·1 citations·filing 2010–2024
28Inventor score
Top patents by PatentIndex Score
4 records- 0178US12196687B2Method for inspecting pattern defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 14, 2025·1 cites·20 claims
- 0257US2025093278A1Method for inspecting pattern defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0339US2024422247A1Signal processing method and associated relay deviceREALTEK SEMICONDUCTOR CORP·Filed 2024·Application pending·0 cites
- 0426US8411142B2Intellectual surveillance system and monitoring method thereofLEE CHE-YEN·Filed 2010·Granted Apr 2, 2013·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →