Inventor · disambiguated record
Chui-Fu Chiu
Also filed as: CHIU CHUI FU
7 granted patents·5 pending applications·33 citations·filing 2006–2013
81Inventor score
Top patents by PatentIndex Score
12 records- 0187US7480892B2Overlay markNANYA TECHNOLOGY CORP·Filed 2006·Granted Jan 20, 2009·12 cites·1 claims
- 0285US8143731B2Integrated alignment and overlay markCHIU CHUI-FU·Filed 2009·Granted Mar 27, 2012·12 cites·20 claims
- 0375US8535858B2Photomask and method for forming overlay mark using the sameNANYA TECHNOLOGY CORP·Filed 2013·Granted Sep 17, 2013·2 cites·6 claims
- 0471US7933015B2Mark for alignment and overlay, mask having the same, and method of using the sameNANYA TECHNOLOGY CORP·Filed 2008·Granted Apr 26, 2011·5 cites·5 claims
- 0562US8745546B2Mask overlay method, mask, and semiconductor device using the sameCHIU CHUI-FU·Filed 2011·Granted Jun 3, 2014·1 cites·13 claims
- 0660US7582395B2Overlay markNANYA TECHNOLOGY CORP·Filed 2006·Granted Sep 1, 2009·1 cites·4 claims
- 0748US9017926B2Overlay mark and method of forming the sameCHIU CHUI-FU·Filed 2012·Granted Apr 28, 2015·0 cites·2 claims
- 0845US2012237857A1Photomask and method for forming overlay mark using the sameCHIU CHUI FU·Filed 2011·Application pending·0 cites
- 0936US2012308788A1Overlay mark set and method for positioning two different layout patternsCHIU CHUI-FU·Filed 2011·Application pending·0 cites
- 1035US2012140193A1Dynamic wafer alignment method in exposure scanner systemCHIU CHUI-FU·Filed 2010·Application pending·0 cites
- 1134US2012299204A1Overlay mark and method for fabricating the sameCHIU CHUI FU·Filed 2011·Application pending·0 cites
- 1234US2013147129A1Wafer supporting structureCHIU CHUI FU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →