Inventor · disambiguated record
Tatsuo Akiyama
Also filed as: AKIYAMA TATSUO
23 granted patents·4 pending applications·472 citations·filing 1980–2018
95Inventor score
Top patents by PatentIndex Score
27 records- 0196US5643046APolishing method and apparatus for detecting a polishing end point of a semiconductor waferTOSHIBA KK·Filed 1995·Granted Jul 1, 1997·207 cites·9 claims
- 0286US4710794AComposite semiconductor deviceTOSHIBA KK·Filed 1986·Granted Dec 1, 1987·78 cites·6 claims
- 0382US7702413B2Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulatorTOSHIBA KK·Filed 2004·Granted Apr 20, 2010·22 cites·17 claims
- 0477US10867394B2Object tracking device, object tracking method, and recording mediumNEC CORP·Filed 2017·Granted Dec 15, 2020·3 cites·8 claims
- 0572US4729966AProcess for manufacturing a Schottky FET device using metal sidewalls as gatesTOSHIBA KK·Filed 1986·Granted Mar 8, 1988·29 cites·6 claims
- 0665US8520981B2Document retrieval of feature point groups using a geometrical transformationAKIYAMA TATSUO·Filed 2008·Granted Aug 27, 2013·4 cites·21 claims
- 0765US4532004AMethod of manufacturing a semiconductor deviceTOSHIBA KK·Filed 1984·Granted Jul 30, 1985·26 cites·6 claims
- 0863US7272460B2Method for designing a manufacturing process, method for providing manufacturing process design and technology computer-aided design systemTOSHIBA KK·Filed 2004·Granted Sep 18, 2007·9 cites·12 claims
- 0957US2002138404A1Mas trading system and methodFiled 2002·Application pending·0 cites
- 1056US8199970B2Moving amount calculation system and obstacle detection systemAKIYAMA TATSUO·Filed 2007·Granted Jun 12, 2012·2 cites·35 claims
- 1153US5031021ASemiconductor device with a high breakdown voltageTOSHIBA KK·Filed 1986·Granted Jul 9, 1991·14 cites·3 claims
- 1252US5229323AMethod for manufacturing a semiconductor device with Schottky electrodesTOSHIBA KK·Filed 1992·Granted Jul 20, 1993·23 cites·25 claims
- 1350US6657735B2Method of evaluating critical locations on a semiconductor apparatus patternTOSHIBA KK·Filed 2001·Granted Dec 2, 2003·3 cites·9 claims
- 1448US11494922B2Object tracking device, object tracking method, and object tracking programNEC CORP·Filed 2018·Granted Nov 8, 2022·0 cites·10 claims
- 1548US11341739B2Image processing device, image processing method, and program recording mediumNEC CORP·Filed 2017·Granted May 24, 2022·0 cites·7 claims
- 1648US9836665B2Management system, list production device, method, computer readable recording medium, data structure, and printed labelNEC CORP·Filed 2014·Granted Dec 5, 2017·0 cites·15 claims
- 1748US9830336B2Information processing device, information processing method and information processing programNEC CORP·Filed 2013·Granted Nov 28, 2017·0 cites·11 claims
- 1848US6775816B2Semiconductor design/fabrication system, semiconductor design/fabrication method and semiconductor design/fabrication programTOSHIBA KK·Filed 2002·Granted Aug 10, 2004·2 cites·20 claims
- 1946US5049954AGaAs field effect semiconductor device having Schottky gate structureTOSHIBA KK·Filed 1989·Granted Sep 17, 1991·10 cites·3 claims
- 2045US5260603AElectrode structure of semiconductor device for use in GaAs compound substrateTOSHIBA KK·Filed 1992·Granted Nov 9, 1993·12 cites·8 claims
- 2143US5374835AField effect transistor using compound semiconductorTOSHIBA KK·Filed 1993·Granted Dec 20, 1994·11 cites·3 claims
- 2239US9430711B2Feature point matching device, feature point matching method, and non-transitory computer readable medium storing feature matching programAKIYAMA TATSUO·Filed 2011·Granted Aug 30, 2016·0 cites·20 claims
- 2339US2014044377A1Shot image processing system, shot image processing method, mobile terminal, and information processing apparatusYACHIDA SHOJI·Filed 2012·Application pending·0 cites
- 2439US2003014146A1Dangerous process/pattern detection system and method, danger detection program, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2002·Application pending·0 cites
- 2539US2013208990A1Image comparison device, image comparison method, image comparison system, server, terminal, terminal control method, and terminal control programAKIYAMA TATSUO·Filed 2011·Application pending·0 cites
- 2637US4700455AMethod of fabricating Schottky gate-type GaAs field effect transistorTOSHIBA KK·Filed 1985·Granted Oct 20, 1987·7 cites·7 claims
- 2736US4352726AIon selective field-effect sensorTAKASHI MUKAIBO·Filed 1980·Granted Oct 5, 1982·10 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Tatsuo Akiyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →