Inventor · disambiguated record
Wang Jo Fei
Also filed as: FEI WANG JO
3 granted patents·38 citations·filing 2009–2009
68Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0192US8229588B2Method and system for tuning advanced process control parametersTSEN ANDY·Filed 2009·Granted Jul 24, 2012·32 cites·17 claims
- 0265US8392009B2Advanced process control with novel sampling policyFEI WANG JO·Filed 2009·Granted Mar 5, 2013·4 cites·19 claims
- 0364US8219341B2System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing modelTSEN ANDY·Filed 2009·Granted Jul 10, 2012·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →