Inventor · disambiguated record
William R. Creek
Also filed as: CREEK WILLIAM · CREEK WILLIAM R · CREEK WILLIAM ROBERT
12 granted patents·309 citations·filing 1997–2011
92Inventor score
Top patents by PatentIndex Score
12 records- 0182US6625557B1Mixed signal device under test board interfaceLTX CORP·Filed 1998·Granted Sep 23, 2003·63 cites·22 claims
- 0281US8207725B2Tester having device under test power supplySULLIVAN PATRICK·Filed 2011·Granted Jun 26, 2012·7 cites·20 claims
- 0381US5771002ATracking system using radio frequency signalsUNIV LELAND STANFORD JUNIOR·Filed 1997·Granted Jun 23, 1998·124 cites·31 claims
- 0478US6703825B1Separating device response signals from composite signalsLTX CORP·Filed 2003·Granted Mar 9, 2004·19 cites·17 claims
- 0574US6563298B1Separating device response signals from composite signalsLTX CORP·Filed 2000·Granted May 13, 2003·16 cites·25 claims
- 0672US6700396B1Integrated micromachine relay for automated test equipment applicationsLTX CORP·Filed 2001·Granted Mar 2, 2004·14 cites·23 claims
- 0761US6052810ADifferential driver circuit for use in automatic test equipmentLTX CORP·Filed 1998·Granted Apr 18, 2000·23 cites·19 claims
- 0859US7999530B2Device under test power supplyINTERSIL INC·Filed 2009·Granted Aug 16, 2011·3 cites·20 claims
- 0954US6903562B1Integrated micromachine relay for automated test equipment applicationsLTX CORP·Filed 2003·Granted Jun 7, 2005·5 cites·17 claims
- 1053US6933746B1Method and apparatus for coupling an input node to an output nodePLANET ATE INC·Filed 2003·Granted Aug 23, 2005·7 cites·20 claims
- 1150US6211723B1Programmable load circuit for use in automatic test equipmentLTX CORP·Filed 1999·Granted Apr 3, 2001·18 cites·22 claims
- 1242US6323694B1Differential comparator with a programmable voltage offset for use in an automatic testerLTX CORP·Filed 1998·Granted Nov 27, 2001·10 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →