Inventor · disambiguated record
Rochit Rajsuman
Also filed as: RAJSUMAN ROCHIT
29 granted patents·6 pending applications·1,320 citations·filing 1990–2011
98Inventor score
Top patents by PatentIndex Score
35 records- 0197US6249893B1Method and structure for testing embedded cores based system-on-a-chipADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·199 cites·17 claims
- 0295US6678645B1Method and apparatus for SoC design validationADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·276 cites·33 claims
- 0393US6651204B1Modular architecture for memory testing on event based test systemADVANTEST CORP·Filed 2000·Granted Nov 18, 2003·64 cites·13 claims
- 0490US6377065B1Glitch detection for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Apr 23, 2002·50 cites·12 claims
- 0589US6567941B1Event based test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2000·Granted May 20, 2003·43 cites·7 claims
- 0686US6532561B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Mar 11, 2003·62 cites·12 claims
- 0785US6408412B1Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chipADVANTEST CORP·Filed 1999·Granted Jun 18, 2002·56 cites·15 claims
- 0881US6948105B2Method of evaluating core based system-on-a-chip (SoC) and structure of SoC incorporating sameADVANTEST CORP·Filed 2001·Granted Sep 20, 2005·24 cites·6 claims
- 0981US6804620B1Calibration method for system performance validation of automatic test equipmentADVANTEST CORP·Filed 2003·Granted Oct 12, 2004·31 cites·36 claims
- 1081US6747447B2Locking apparatus and loadboard assemblyADVANTEST CORP·Filed 2002·Granted Jun 8, 2004·30 cites·13 claims
- 1181US6629282B1Module based flexible semiconductor test systemADVANTEST CORP·Filed 1999·Granted Sep 30, 2003·59 cites·14 claims
- 1281US6108805ADomino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuitsLSI LOGIC CORP·Filed 1997·Granted Aug 22, 2000·43 cites·13 claims
- 1381US5670890ASwitchable pull-ups and pull-downs for IDDQ testing of integrated circuitsLSI LOGIC CORP·Filed 1995·Granted Sep 23, 1997·55 cites·20 claims
- 1480US5377148AApparatus and method to test random access memories for a plurality of possible types of faultsUNIV CASE WESTERN RESERVE·Filed 1990·Granted Dec 27, 1994·47 cites·15 claims
- 1579US6404218B1Multiple end of test signal for event based test systemADVANTEST CORP·Filed 2000·Granted Jun 11, 2002·24 cites·14 claims
- 1676US7089517B2Method for design validation of complex ICADVANTEST CORP·Filed 2001·Granted Aug 8, 2006·23 cites·19 claims
- 1775US6578169B1Data failure memory compaction for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·19 cites·9 claims
- 1872US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 1972US5644251ASwitchable pull-ups and pull-downs for IDDQ testing of integrated circuitsLSI LOGIC CORP·Filed 1995·Granted Jul 1, 1997·35 cites·33 claims
- 2071US7178115B2Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturingADVANTEST CORP·Filed 2003·Granted Feb 13, 2007·15 cites·18 claims
- 2167US5963566AApplication specific integrated circuit chip and method of testing sameLSI LOGIC CORP·Filed 1996·Granted Oct 5, 1999·28 cites·15 claims
- 2267US5867036ADomino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuitsLSI LOGIC CORP·Filed 1996·Granted Feb 2, 1999·25 cites·24 claims
- 2364US6249889B1Method and structure for testing embedded memoriesADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·44 cites·7 claims
- 2460US6249892B1Circuit structure for testing microprocessors and test method thereofADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·37 cites·16 claims
- 2557US6944808B2Method of evaluating core based system-on-a-chipADVANTEST CORP·Filed 2002·Granted Sep 13, 2005·5 cites·15 claims
- 2657US6594609B1Scan vector support for event based test systemADVANTEST CORP·Filed 2000·Granted Jul 15, 2003·6 cites·10 claims
- 2742US6791316B2High speed semiconductor test system using radially arranged pin cardsADVANTEST CORP·Filed 2002·Granted Sep 14, 2004·1 cites·7 claims
- 2842US2012256442A1Sun protection apparatus for automobile driver or passengerRAJSUMAN ROCHIT·Filed 2011·Application pending·0 cites
- 2942US2004181731A1Semiconductor test system storing pin calibration data, commands and other data in non-volatile memoryADVANTEST CORP·Filed 2004·Application pending·0 cites
- 3039US6915469B2High speed vector access method from pattern memory for test systemsADVANTEST CORP·Filed 2002·Granted Jul 5, 2005·2 cites·33 claims
- 3139US2004019550A1Intangible property enumerating method and systemFiled 2002·Application pending·0 cites
- 3238US7194668B2Event based test method for debugging timing related failures in integrated circuitsADVANTEST CORP·Filed 2003·Granted Mar 20, 2007·2 cites·20 claims
- 3337US2003217341A1Architecture and design of universal IC test systemFiled 2002·Application pending·0 cites
- 3435US2002173942A1Method and apparatus for design validation of complex IC without using logic simulationFiled 2002·Application pending·0 cites
- 3534US2003110427A1Semiconductor test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →