Inventor · disambiguated record
Minh H. Tong
Also filed as: TONG MINH · TONG MINH H · TONG MINH HO
48 granted patents·1 pending application·1,739 citations·filing 1987–2005
99Inventor score
Files withIBM48
Top patents by PatentIndex Score
49 records- 0197US5629544ASemiconductor diode with silicide films and trench isolationIBM·Filed 1995·Granted May 13, 1997·202 cites·42 claims
- 0296US5874836AHigh reliability I/O stacked fetsIBM·Filed 1996·Granted Feb 23, 1999·129 cites·10 claims
- 0395US6512269B1High-voltage high-speed SOI MOSFETIBM·Filed 2000·Granted Jan 28, 2003·96 cites·12 claims
- 0494US6424174B1Low leakage logic gatesIBM·Filed 2001·Granted Jul 23, 2002·59 cites·43 claims
- 0593US6475838B1Methods for forming decoupling capacitorsIBM·Filed 2000·Granted Nov 5, 2002·79 cites·17 claims
- 0691US5528188AElectrostatic discharge suppression circuit employing low-voltage triggering silicon-controlled rectifierIBM·Filed 1995·Granted Jun 18, 1996·113 cites·6 claims
- 0790US6498058B1SOI pass-gate disturb solutionIBM·Filed 2000·Granted Dec 24, 2002·42 cites·7 claims
- 0889US6552396B1Matched transistors and methods for forming the sameIBM·Filed 2000·Granted Apr 22, 2003·52 cites·16 claims
- 0989US6239649B1Switched body SOI (silicon on insulator) circuits and fabrication method thereforIBM·Filed 1999·Granted May 29, 2001·78 cites·10 claims
- 1089US5959335ADevice design for enhanced avalanche SOI CMOSIBM·Filed 1998·Granted Sep 28, 1999·67 cites·11 claims
- 1187US6100564ASOI pass-gate disturb solutionIBM·Filed 1998·Granted Aug 8, 2000·72 cites·5 claims
- 1287US5973508AVoltage translation circuit for mixed voltage applicationsIBM·Filed 1997·Granted Oct 26, 1999·55 cites·16 claims
- 1386US6249029B1Device method for enhanced avalanche SOI CMOSIBM·Filed 1999·Granted Jun 19, 2001·54 cites·10 claims
- 1483US5672994AAntifuse circuit using standard MOSFET devicesIBM·Filed 1995·Granted Sep 30, 1997·65 cites·4 claims
- 1582US6469350B1Active well schemes for SOI technologyIBM·Filed 2001·Granted Oct 22, 2002·27 cites·5 claims
- 1682US5485095AFabrication test circuit and method for signalling out-of-spec resistance in integrated circuit structureIBM·Filed 1994·Granted Jan 16, 1996·51 cites·33 claims
- 1778US6100153AReliable diffusion resistor and diffusion capacitorIBM·Filed 1998·Granted Aug 8, 2000·43 cites·2 claims
- 1876US6455766B1Contact-less probe of semiconductor wafersIBM·Filed 2001·Granted Sep 24, 2002·30 cites·10 claims
- 1976US5831452ALeak tolerant low power dynamic circuitsIBM·Filed 1997·Granted Nov 3, 1998·29 cites·12 claims
- 2075US6436744B1Method and structure for creating high density buried contact for use with SOI processes for high performance logicIBM·Filed 2001·Granted Aug 20, 2002·22 cites·13 claims
- 2174US5543650AElectrostatic discharge protection circuit employing a mosfet deviceIBM·Filed 1996·Granted Aug 6, 1996·37 cites·19 claims
- 2270US6664150B2Active well schemes for SOI technologyIBM·Filed 2002·Granted Dec 16, 2003·14 cites·8 claims
- 2370US6088206AClamp circuit to limit overdrive of off chip driverIBM·Filed 1998·Granted Jul 11, 2000·25 cites·5 claims
- 2469US6300785B1Contact-less probe of semiconductor wafersIBM·Filed 1998·Granted Oct 9, 2001·32 cites·28 claims
- 2568US6097068ASemiconductor device fabrication method and apparatus using connecting implantsIBM·Filed 1998·Granted Aug 1, 2000·31 cites·5 claims
- 2664US6404236B1Domino logic circuit having multiplicity of gate dielectric thicknessesIBM·Filed 2001·Granted Jun 11, 2002·10 cites·8 claims
- 2763US6191451B1Semiconductor device with decoupling capacitanceIBM·Filed 1998·Granted Feb 20, 2001·18 cites·16 claims
- 2861US6528846B1Asymmetric high voltage silicon on insulator device design for input output circuitsIBM·Filed 1999·Granted Mar 4, 2003·20 cites·11 claims
- 2961US5972745AMethod or forming self-aligned halo-isolated wellsIBM·Filed 1997·Granted Oct 26, 1999·25 cites·19 claims
- 3060US7266663B2Automatic cache activation and deactivation for power reductionIBM·Filed 2005·Granted Sep 4, 2007·3 cites·16 claims
- 3160US6365484B1Method of forming semiconductor device with decoupling capacitanceIBM·Filed 2000·Granted Apr 2, 2002·7 cites·6 claims
- 3260US5878094ANoise detection and delay receiver systemIBM·Filed 1997·Granted Mar 2, 1999·16 cites·15 claims
- 3359US6333230B1Scalable high-voltage devicesIBM·Filed 2000·Granted Dec 25, 2001·6 cites·10 claims
- 3459US6011419ADecoupling scheme for mixed voltage integrated circuitsIBM·Filed 1997·Granted Jan 4, 2000·17 cites·22 claims
- 3557US6239591B1Method and apparatus for monitoring SOI hysterises effectsIBM·Filed 1999·Granted May 29, 2001·21 cites·8 claims
- 3655US6459106B2Dynamic threshold voltage devices with low gate to substrate resistanceIBM·Filed 2001·Granted Oct 1, 2002·5 cites·7 claims
- 3755US6200843B1High-voltage, high performance FETsIBM·Filed 1998·Granted Mar 13, 2001·15 cites·4 claims
- 3854US6838323B2Diffusion resistor/capacitor (DRC) non-aligned MOSFET structureIBM·Filed 2003·Granted Jan 4, 2005·5 cites·13 claims
- 3954US6054354AHigh voltage field effect transistors with selective gate depletionIBM·Filed 1998·Granted Apr 25, 2000·14 cites·31 claims
- 4052US4811298ADecoding circuit arrangement for redundant semiconductor storage systemsIBM·Filed 1987·Granted Mar 7, 1989·14 cites·10 claims
- 4151US6057204AMethod of making a noise-isolated buried resistor by implanting a first well with a mask and then implanting an opposite conductivity well with a larger opening in the maskIBM·Filed 1999·Granted May 2, 2000·11 cites·4 claims
- 4244US6057184ASemiconductor device fabrication method using connecting implantsIBM·Filed 1997·Granted May 2, 2000·10 cites·11 claims
- 4343US6437594B1SOI pass gate leakage monitorIBM·Filed 2000·Granted Aug 20, 2002·2 cites·26 claims
- 4443US6429056B1Dynamic threshold voltage devices with low gate to substrate resistanceIBM·Filed 1999·Granted Aug 6, 2002·6 cites·6 claims
- 4541US5883566ANoise-isolated buried resistorIBM·Filed 1997·Granted Mar 16, 1999·6 cites·33 claims
- 4633US6249028B1Operable floating gate contact for SOI with high Vt wellIBM·Filed 1998·Granted Jun 19, 2001·2 cites·5 claims
- 4730US6171918B1Depleted poly mosfet structure and methodIBM·Filed 1998·Granted Jan 9, 2001·0 cites·14 claims
- 4830US2002060343A1Diffusion resistor/capacitor (drc) non-aligned mosfet structureFiled 1999·Application pending·0 cites
- 4929US6400171B2Method and system for processing integrated circuitsIBM·Filed 1999·Granted Jun 4, 2002·2 cites·12 claims
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