Inventor · disambiguated record
Xianyun Ma
Also filed as: MA XIANYUN
3 granted patents·1 pending application·29 citations·filing 1997–2006
69Inventor score
Top patents by PatentIndex Score
4 records- 0175US7220978B2System and method for detecting defects in semiconductor wafersUNIV SOUTH CAROLINA·Filed 2003·Granted May 22, 2007·16 cites·33 claims
- 0255US7679381B2Method and apparatus for nondestructively evaluating light-emitting materialsMAXMILE TECHNOLOGIES LLC·Filed 2006·Granted Mar 16, 2010·5 cites·23 claims
- 0331US5973492AHigh accuracy optical current transducer thta eliminates birefringenceFiled 1997·Granted Oct 26, 1999·8 cites·16 claims
- 0431US2007170934A1Method and Apparatus for Nondestructive Evaluation of Semiconductor WafersMAXMILE TECHNOLOGIES LLC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →