Inventor · disambiguated record
Jeffrey Hawthorne
Also filed as: HAWTHORNE JEFFREY · HAWTHORNE JEFFREY A · HAWTHORNE JEFFREY ALAN
22 granted patents·577 citations·filing 1992–2020
96Inventor score
Top patents by PatentIndex Score
22 records- 0192US7107158B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2005·Granted Sep 12, 2006·18 cites·35 claims
- 0292US5764209AFlat panel display inspection systemPHOTON DYNAMICS INC·Filed 1995·Granted Jun 9, 1998·156 cites·20 claims
- 0391US7634365B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2008·Granted Dec 15, 2009·16 cites·33 claims
- 0491US5917935AMura detection apparatus and methodPHOTON DYNAMICS INC·Filed 1996·Granted Jun 29, 1999·179 cites·45 claims
- 0582US5754678ASubstrate inspection apparatus and methodPHOTON DYNAMICS INC·Filed 1996·Granted May 19, 1998·90 cites·23 claims
- 0681US7337076B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2006·Granted Feb 26, 2008·6 cites·20 claims
- 0780US7092826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2005·Granted Aug 15, 2006·6 cites·28 claims
- 0877US7659734B2Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illuminationQCEPT TECHNOLOGIES INC·Filed 2007·Granted Feb 9, 2010·7 cites·29 claims
- 0974US6957154B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2003·Granted Oct 18, 2005·14 cites·18 claims
- 1073US7379826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2006·Granted May 27, 2008·3 cites·20 claims
- 1171US7103482B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2004·Granted Sep 5, 2006·10 cites·24 claims
- 1268US7095883B2Moiré suppression method and apparatusPHOTON DYNAMICS INC·Filed 2002·Granted Aug 22, 2006·13 cites·20 claims
- 1367US7308157B2Method and apparatus for optical inspection of a displayPHOTON DYNAMICS INC·Filed 2004·Granted Dec 11, 2007·16 cites·20 claims
- 1466US7308367B2Wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 11, 2007·7 cites·44 claims
- 1563US7900526B2Defect classification utilizing data from a non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2007·Granted Mar 8, 2011·2 cites·21 claims
- 1658US7152476B2Measurement of motions of rotating shafts using non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 26, 2006·5 cites·19 claims
- 1757US7330583B2Integrated visual imaging and electronic sensing inspection systemsPHOTON DYNAMICS INC·Filed 2002·Granted Feb 12, 2008·6 cites·22 claims
- 1856US11261529B2Reduced visibility conductive micro mesh touch sensorFUTURETECH CAPITAL INC·Filed 2020·Granted Mar 1, 2022·0 cites·17 claims
- 1955US8275564B2Patterned wafer inspection system using a non-vibrating contact potential difference sensorSCHULZE MARK A·Filed 2010·Granted Sep 25, 2012·1 cites·16 claims
- 2051US6882899B2Sensing head positioning system using two-stage offset air bearingsPHOTON DYNAMICS INC·Filed 2001·Granted Apr 19, 2005·5 cites·27 claims
- 2149US11157122B1Method to design low visibility metal mesh touch sensorFUTURETECH CAPITAL INC·Filed 2020·Granted Oct 26, 2021·0 cites·20 claims
- 2240US5241661ADMA access arbitration device in which CPU can arbitrate on behalf of attachment having no arbiterIBM·Filed 1992·Granted Aug 31, 1993·17 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →