Inventor · disambiguated record

Takehiro Tatizaki

Also filed as: TATIZAKI TAKEHIRO

1 granted patent·1 citations·filing 2012–2012

15Inventor score

Technology areasG11B

Files withHITACHI HIGH TECH CORP1

Top patents by PatentIndex Score

1 record

0160US8713710B2Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 29, 2014·1 cites·14 claims

Join the waitlist — get patent alerts

Get an alert when Takehiro Tatizaki files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →