Inventor · disambiguated record
Huo-Kang Hsu
Also filed as: HSU HUO-KANG
5 granted patents·3 citations·filing 2014–2022
64Inventor score
Files withMPI CORP5
Top patents by PatentIndex Score
5 records- 0176US11150269B2Probe head for high frequency signal test and medium or low frequency signal test at the same timeMPI CORP·Filed 2020·Granted Oct 19, 2021·1 cites·18 claims
- 0265US9643271B2Method for making support structure for probing deviceMPI CORP·Filed 2015·Granted May 9, 2017·2 cites·15 claims
- 0358US12099078B2Probe card and wafer testing assembly thereofMPI CORP·Filed 2022·Granted Sep 24, 2024·0 cites·19 claims
- 0456US11402407B2Positionable probe card and manufacturing method thereofMPI CORP·Filed 2020·Granted Aug 2, 2022·0 cites·18 claims
- 0539US9442135B2Method of manufacturing space transformer for probe cardMPI CORP·Filed 2014·Granted Sep 13, 2016·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →