Inventor · disambiguated record
Ryu Makabe
Also filed as: MAKABE RYU
10 granted patents·3 pending applications·65 citations·filing 2000–2022
88Inventor score
Top patents by PatentIndex Score
13 records- 0181US7288837B2Semiconductor device and its writing methodRENESAS TECH CORP·Filed 2006·Granted Oct 30, 2007·8 cites·1 claims
- 0279US7547963B2Semiconductor device and its wiring methodRENESAS TECH CORP·Filed 2007·Granted Jun 16, 2009·7 cites·3 claims
- 0377US7071574B1Semiconductor device and its wiring methodRENESAS TECH CORP·Filed 2000·Granted Jul 4, 2006·20 cites·12 claims
- 0469US6577553B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 10, 2003·14 cites·16 claims
- 0560US2024051789A1Guidance systemMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 0659US7078805B2Semiconductor wafer, semiconductor chip and dicing method of a semiconductor waferRENESAS TECH CORP·Filed 2003·Granted Jul 18, 2006·5 cites·2 claims
- 0757US7638411B2Semiconductor wafer, semiconductor chip and dicing method of a semiconductor waferRENESAS TECH CORP·Filed 2008·Granted Dec 29, 2009·0 cites·3 claims
- 0857US6707735B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Mar 16, 2004·9 cites·16 claims
- 0954US2023078706A1Elevator device and elevator control deviceMITSUBISHI ELECTRIC CORP·Filed 2020·Application pending·0 cites
- 1052US7416964B2Semiconductor wafer, semiconductor chip and dicing method of a semiconductor waferRENESAS TECH CORP·Filed 2006·Granted Aug 26, 2008·0 cites·5 claims
- 1148US2024378923A1Interest degree measurement system and simulation systemMITSUBISHI ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 1240USRE41245ESemiconductor memory deviceRENESAS TECH CORP·Filed 2005·Granted Apr 20, 2010·0 cites·31 claims
- 1338US6795943B2Semiconductor device with test modeRENESAS TECH CORP·Filed 2001·Granted Sep 21, 2004·2 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →