Inventor · disambiguated record
Kent P. Fancher
Also filed as: FANCHER KENT P
2 granted patents·16 citations·filing 2009–2012
59Inventor score
Technology areasG11C
Top patents by PatentIndex Score
2 records- 0179US8531899B2Methods for testing a memory embedded in an integrated circuitZHANG SHAYAN·Filed 2012·Granted Sep 10, 2013·6 cites·11 claims
- 0278US8379466B2Integrated circuit having an embedded memory and method for testing the memoryFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Feb 19, 2013·10 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →