Inventor · disambiguated record
Hong Kim
Also filed as: KIM HONG · KIM HONG S · KIM HONG-SAM
15 granted patents·260 citations·filing 2000–2011
93Inventor score
Top patents by PatentIndex Score
15 records- 0197US7036098B2On-chip signal state duration measurement and adjustmentSUN MICROSYSTEMS INC·Filed 2003·Granted Apr 25, 2006·119 cites·27 claims
- 0281US8774802B2Method and apparatus for EPLMN list management in mobile terminalKIM HONG·Filed 2011·Granted Jul 8, 2014·6 cites·20 claims
- 0379US6675300B1Remote controlled computer system and management method having an identification numberSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jan 6, 2004·33 cites·24 claims
- 0478US6802010B1Multiple user computer system and method for remote control thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Oct 5, 2004·29 cites·20 claims
- 0577US7034576B2Pulsed dynamic keeper gatingSUN MICROSYSTEMS INC·Filed 2003·Granted Apr 25, 2006·20 cites·28 claims
- 0675US7020785B2Method for automatically verifying security code of computer system operated by remote controllerSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Mar 28, 2006·22 cites·9 claims
- 0767US7977806B2Portable electronic device including electric generatorSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 12, 2011·4 cites·14 claims
- 0866US7275257B1Remote controlled computer system and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 25, 2007·11 cites·22 claims
- 0962US7890779B2Method and apparatus for providing updated information using power control in portable terminal deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 15, 2011·4 cites·22 claims
- 1048US7131034B2On-chip measurement of signal state durationSUN MICROSYSTEMS INC·Filed 2002·Granted Oct 31, 2006·4 cites·26 claims
- 1145US7055135B2Method for debugging an integrated circuitSUN MICROSYSTEMS INC·Filed 2002·Granted May 30, 2006·2 cites·17 claims
- 1243US6891403B2On-chip PLL locked frequency determination method and systemSUN MICROSYSTEMS INC·Filed 2002·Granted May 10, 2005·2 cites·9 claims
- 1341US6870781B2Semiconductor device verification system and methodSUN MICROSYSTEMS INC·Filed 2002·Granted Mar 22, 2005·4 cites·20 claims
- 1433US7085176B1On-chip power-on voltage initializationSUN MICROSYSTEMS INC·Filed 2004·Granted Aug 1, 2006·0 cites·49 claims
- 1532US7017088B2Graphical system and automated pattern generator for testing arraysSUN MICROSYSTEMS INC·Filed 2001·Granted Mar 21, 2006·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →