Inventor · disambiguated record
Wael Badawy
Also filed as: BADAWY WAEL
12 granted patents·2 pending applications·272 citations·filing 2004–2014
92Inventor score
Files withINTELLIVIEW TECHNOLOGIES INC4INTELLIVIEW TECH INC3BADAWY WAEL2CETECH SOLUTIONS INC2AMER IHAB1
Top patents by PatentIndex Score
14 records- 0194US9014429B2Analyzing a segment of videoINTELLIVIEW TECHNOLOGIES INC·Filed 2013·Granted Apr 21, 2015·82 cites·17 claims
- 0292US10943357B2Video based indoor leak detectionINTELLIVIEW TECH INC·Filed 2014·Granted Mar 9, 2021·32 cites·17 claims
- 0391US8630497B2Analyzing a segment of videoBADAWY WAEL·Filed 2007·Granted Jan 14, 2014·51 cites·19 claims
- 0487US7616782B2Mesh based frame processing and applicationsINTELLIVIEW TECHNOLOGIES INC·Filed 2004·Granted Nov 10, 2009·33 cites·32 claims
- 0583US7986810B2Mesh based frame processing and applicationsINTELLIVIEW TECHNOLOGIES INC·Filed 2009·Granted Jul 26, 2011·7 cites·6 claims
- 0682US7612666B2Video based monitoring systemBADAWY WAEL·Filed 2004·Granted Nov 3, 2009·47 cites·33 claims
- 0776US10234354B2Leak detectionINTELLIVIEW TECH INC·Filed 2014·Granted Mar 19, 2019·5 cites·16 claims
- 0867US8116372B1Data structure and method using same for encoding video informationAMER IHAB·Filed 2007·Granted Feb 14, 2012·4 cites·20 claims
- 0963US10373470B2Object detectionINTELLIVIEW TECH INC·Filed 2013·Granted Aug 6, 2019·3 cites·9 claims
- 1058US9208554B2Apparatus for detecting humans on conveyor belts using one or more imaging devicesSHEHATA MOHAMED·Filed 2012·Granted Dec 8, 2015·3 cites·15 claims
- 1147US2008315886A1Field imagerCETECH SOLUTIONS INC·Filed 2008·Application pending·0 cites
- 1246US8045761B2Detection of environmental conditions in a sequence of imagesINTELLIVIEW TECHNOLOGIES INC·Filed 2006·Granted Oct 25, 2011·3 cites·13 claims
- 1345US2007241748A1Field imagerCETECH SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 1437US7405562B2Magnetic field imaging detection apparatusGHALLAB YEHYA·Filed 2004·Granted Jul 29, 2008·2 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →