Inventor · disambiguated record
Hyun-Tae Kang
Also filed as: KANG HYUN-TAE
3 granted patents·1 pending application·20 citations·filing 2002–2008
61Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0171US6826743B2Method for automatically correcting overlay alignment of a semiconductor waferSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 30, 2004·18 cites·1 claims
- 0255US7081952B2Method and apparatus for obtaining an image using a selective combination of wavelengths of lightSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jul 25, 2006·2 cites·12 claims
- 0344US2008230929A1Overlay mark of semiconductor device and semiconductor device including the overlay markSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0441US7693682B2Method for measuring critical dimensions of a pattern using an overlay measuring apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 6, 2010·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →